EMC SOLUTION

SEMCAD X Matterhorn EMC Solution harnesses the full power of FDTD to solve and accurately predict emission and EM compatibility (EMC) issues. Accurate emission and interference testing is extended beyond standard measurements, and time to market is significantly accelerated, to achieve a competitive edge.

Application Areas	Interference and emission simulations Virtual transverse EM (TEM) cells Virtual anechoic and reverberation chambers Printed circuit board (PCB) noise radiation Nuclear EM pulse testing in a semi-anechoic chamber GPU chip and board simulations Optimization of signal integrity on multilayer PCBs Automated electrostatic discharge (ESD) simulations
Selected Features	Automatization for ESD simulation Analytic boundaries (Mur, Higdon) Uni-anisotropic perfectly matched layer (UPML) and convolutional perfectly matched layer (CPML) boundaries with adjustable absorption Surface impedance boundary conditions (SIBC) accelerated for broadband and harmonic simulations User-defined signal source (pulse, step, saw, arbitrary, etc.)

EMC SOLUTION

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